]> http://www.instrumentationews.com/taxonomy/term/57/0 en http://www.instrumentationews.com/bedemetrix_f_offers_combined_xrr_xrf_capability_for_high_speed_film_thickness_measurements_on_patterned_wafers The family of BedeMetrix™-F tools offers fully-automated X-ray metrology for high volume semiconductor manufacturing. Proven at leading global manufacturers in 24/7 production environments, the tools deliver internally calibrated, non-destructive control of advanced semiconductor processes... Measurement Metrology Radiation Sensors X-Ray Sensors Sun, 28 Aug 2005 04:51:44 +0200 http://www.instrumentationews.com/x_ray_detector_delivers_unique_thin_film_analysis Microbeam X-ray fluorescence metrology systems enable an unprecedented level of analysis for thin film applications in the semiconductor and microelectronics industries Sensors Microelectromechanical (MEMS) X-Ray Sensors Mon, 20 Jun 2005 14:43:11 +0200