Instrumentation and Control News - Metrology

Renishaw Guangzhou branch office now opened

Sun, 07 Jan 2007 12:20:18 +0100

Renishaw has opened a Guangzhou branch office of its wholly owned subsidiary in Shanghai to support its rapidly expanding customer base in south China

High Speed Confocal 3D Measurement System

Mon, 04 Dec 2006 22:39:51 +0100

With a capacity of taking 512,000 measurements per second, the company says the SISCAN M64 is the world's fastest confocal microscopic 3D measurement system, that defect detection is flawless and that the dpm rates are very small.

New combined concept expedites fab ramp-up, saves operational costs

Sun, 03 Dec 2006 16:18:52 +0100

Orbotech introduces breakthrough metrology-on-AOI solution for flat panel display manufacturing

Nanometrics And ASML Enter Into Cross-Licensing Agreement

Sat, 02 Dec 2006 16:18:52 +0100

Metrology within the scanner is a key element for the current performance of ASML lithography systems. With increased access to advanced metrology technology we see further opportunities for advancements in lithography and wafer patterning...

Kiwis help change world-wide measurement standard

Tue, 28 Nov 2006 16:07:59 +0100

Test samples with water from the Antarctic and water from New Zealand proved they were onto something. Further testing concluded that the source of water used in a triple point of water cell indeed had a much larger influence than anyone had realised.

Israeli x-ray metrology company listed in Deloitte’s fast 50 rankings

Mon, 27 Nov 2006 16:07:59 +0100

"Because the Deloitte Brightman Almagor Fast 50 measures sustained revenue growth over five years, being one of the 50 fastest growing technology companies in Israel is an impressive achievement,"

Call for Papers For 2007 Coordinate Metrology Systems Conference

Sat, 25 Nov 2006 21:40:16 +0100

The 2007 event will be held in Reno, Nevada from July 16 - July 20, 2007. The CMSC Society invites metrology users from leading manufacturers and laboratories to submit proposals for application white papers covering their successful, efficient use of 3D coordinate measurement systems.

Vistec wins largest single mask metrology order

Tue, 21 Nov 2006 16:03:20 +0100

The Japanese mask manufacturer will standardize mask inspection at its production facilities around the world, according to Vistec. Some of the tools have already been shipped.

CimCore releases Stinger IIi portable CMM

Wed, 15 Nov 2006 21:14:29 +0100

the Stinger IIi portable arm with infinite rotation and improved counterbalance, complimenting its existing Stinger II range of portable CMMs...

Weight Calibration Package ensures reference consistency.

Tue, 07 Nov 2006 16:07:59 +0100

Troemner, the world's leading manufacturer of precision weights and provider of calibration services, has announced a new Premium NVLAP* Calibration Package for one-piece weights.

S&I is CimCore’s new distributor for Australia-New Zealand region

Mon, 06 Nov 2006 21:14:29 +0100

S&I constantly seeks to add new product lines or upgrade existing products to maintain its position supplying industry benchmark solutions to its clients. The CimCore distributorship brings with it an upgrade in S&I's articulated arm portable CMM range for clients, with related value added accessories.

George Products Company, Inc., a Precision Manufacturer, adds Optical Profiler to their “Pobin” Line of Portable Inspection

Thu, 28 Sep 2006 15:36:57 +0200

Precision Manufacturer adds Optical Profiler to their “Pobin” Line of Portable Inspection Devices. The Optical Automatic Smart Inspection System, dubbed the Oasis, marks the company’s debut into the field of Optical Metrology.

High precision substrate-thickness metrology system launched by ISIS sentronics

Thu, 21 Sep 2006 03:28:47 +0200

The SemDex 300 series incorporates the ISIS patented SCI "Spectral coherence technology" platform which combines in a unique way, very high precision 50nm repeat-rate and better than 200nm absolute accuracies at data acquisition rates of up to 4000/s.

Keithley’s Metrology Services earns ISO 17025 accreditation

Mon, 11 Sep 2006 19:50:48 +0200

This latest accreditation expands the list of Keithley certifications by industry-recognized standards for quality such as ISO 14001 and ISO 9001. The accreditation recognizes that Keithley’s Metrology Services meet the requirements of this international standard, demonstrating its technical competence to carry out very high-level calibrations that are essential for many of Keithley’s instruments

Nova Measuring Instruments to auction patents

Sun, 10 Sep 2006 22:45:46 +0200

Nova is using an auction model to set a market price for patent licenses by offering to the highest bidder licenses for six of its patents, pertaining to using a lithography tool with integrated metrology in semiconductor processing lines. Participants in the auction also have the option to bid for full ownership of the patents