Instrumentation and Control News - Microscopes

Use An SEM For The Day!

Thu, 24 May 2007 23:29:54 +0200

"The TM-1000 is not only extremely easy to use, but also easy to set up. We can arrive first thing in the morning, install the microscope and give some basic training and the user should be up and running by 10.30 AM. We'll leave the system for unlimited use until 4.30 PM, when we'll come and dismantle it and take it away again."

Digital camera available from Testequip

Thu, 08 Mar 2007 03:11:57 +0100

Through a process of capturing multiple images with the sensor shifted a fraction of the length of a pixel the DeltaVu patented technology allows calculation of details much smaller than the size of a pixel...

Holography and Digital Holography Microscopy (DHM)

Sat, 03 Mar 2007 19:48:38 +0100

In holographic microscopy the beam from a coherent light source or laser is split into two beams. One illuminating the object itself and the other providing a reference beam which when recombine with the other beam creates a phase interference that is registered on the hologram plate.

CRAIC Technologies Introduces the UVM-1™ UV-Visible-NIR Broadband Microscope

Tue, 28 Nov 2006 05:01:11 +0100

CRAIC Technologies introduces the UVM-1™ Broadband UV-visible-NIR range microscope. With unparalleled flexibility and power, this microscope can image beyond the visible and by transmission, reflectance and even emission on the sub-micron scale.

Lamar Engineering Department receives major research instrumentation grant

Wed, 08 Nov 2006 20:16:05 +0100

The focus of this grant is to enhance its research infrastructure and capabilities, both of which are critical for advanced research in target research areas, particularly in air quality research. A variety of chemical and petroleum refineries are near Lamar where air pollutants can be tested and analyzed.

Extended Atomic Force Microscopy Scan Head

Wed, 04 Oct 2006 23:37:54 +0200

The design of the head allows a 28-µm scan range in Z for samples with higher features and, in particular, for bioscience applications that include living cells, plant imaging and for pulling on long chained molecules. The extended head utilizes the same Nanopositioning System (NP) sensors found in the standard head...

FEI and Malvern Team up to Develop and Market Advanced Nanoparticle Analysis System

Tue, 19 Sep 2006 00:43:32 +0200

Malvern’s particle image analysis software will be optimized for FEI’s Quanta SEMs. A proven solution, this package is already used on Malvern systems that encompass traditional optical microscopes, such as the Morphologi G2, with many research and industrial users around the world...

Unemployed Scientists Create Ultrapowerful Microscope

Sun, 10 Sep 2006 16:25:23 +0200

The new approach, called photoactivated localization microscopy (PALM), brings researchers far closer to their goal of being able to discriminate molecules that are only two to 25 nanometers apart.

More Moore Develops Innovative Microscope Technology Capable of Viewing Features as Small as 20 Nanometers

Thu, 07 Sep 2006 03:41:40 +0200

Working together, these More Moore participants have created a photoemission electron microscope capable of measuring features as small as 20 nanometers (nm), without destroying the sample. Recently they identified defects of 50 nm buried under the multilayer coating of a mask blank...

A matter of nanometers

Thu, 31 Aug 2006 03:41:40 +0200

The microscope is so powerful that it allows scientists to examine the fundamental organization of the key structures within cells. This new microscope greatly surpasses the resolution of conventional optical microscopes, which are inherently limited by the wavelength of light...

More Details in the Nanocosmos of the Cell

Wed, 23 Aug 2006 03:41:40 +0200

A look at the inside of cells becomes sharper: Both figures above show the filaments in a human nerve cell; left with a common confocal microscope, right with a STED microscope plus mathematical deconvolution. The resolution of the STED microscope is better by more than an order of magnitude.

New Window into Nanoscale Materials Deformation

Sat, 19 Aug 2006 19:35:03 +0200

The research team built a quantitative in situ nanoindenter by integrating a capacitive force sensor from Hysitron into a sample holder designed by NCEM, taking advantage of the in situ microscope's large sample-stage area. For the first time data and movies documenting nanoscale deformation events could be made simultaneously and directly...

A New Window into the Deformation of Nanoscale Materials

Fri, 18 Aug 2006 00:12:53 +0200

Using special instrumentation with the JEOL 3010 In Situ Transmission Electron Microscope at the National Center for Electron Microscopy (NCEM), the researchers were able to correlate high-resolution load-displacement measurements with individual video frames, showing how nanoscale volumes of aluminum deform under stress from a diamond "nanoindenter."

Colour inspection technology introduced

Tue, 25 Jul 2006 20:37:55 +0200

An innovative inspection technology, specifically developed to deliver comprehensive color analysis of multicolored, patterned and textured items, compares images with stored reference images.

Veeco Introduces New ``Low-Cost, High-Value'' Scanning Probe Microscope

Thu, 13 Jul 2006 19:26:57 +0200

The Caliber is able to perform a variety of SPM research and industrial applications on samples of various sizes. The instrument is being shown for the first time on July 18 at Veeco's Annual "Seeing at the Nanoscale Conference," this year being held at the University of Pennsylvania...