The MFP-3D extended head is for use in MFP-3D Atomic Force Microscopy (AFM) Systems. The design of the head allows a 28-µm scan range in Z for samples with higher features and, in particular, for bioscience applications that include living cells, plant imaging and for pulling on long chained molecules. The extended head utilizes the same Nanopositioning System (NP) sensors found in the standard head for superior precision and accuracy, low noise and image clarity. Z Sensor noise is <0.3-nm Adev in a 0.1-Hz to 1-kHz bandwidth (BW) and sensor non-linearity is <0.2% (Adev/full travel) at full scan; Z height noise <0.06-nm Adev, 0.1-Hz to 1-kHz BW.
Asylum Research
6310 Hollister Ave.
Santa Barbara, CA, 93117
Extended Atomic Force Microscopy Scan Head
Submitted by nestorb on Wed, 2006-10-04 17:37.
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